Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11782426 | Abnormality score calculation apparatus, method, and medium | Jumpei ANDO, Wataru Watanabe, Takayuki Itoh | 2023-10-10 |
| 11775512 | Data analysis apparatus, method and system | Wataru Watanabe, Takayuki Itoh, Jumpei ANDO, Keisuke KAWAUCHI | 2023-10-03 |
| 11747424 | Magnetic resonance imaging apparatus, image processing apparatus, and image processing method | Kenzo Isogawa, Kenichi Shimoyama, Nobuyuki Matsumoto, Shuhei Nitta, Satoshi Kawata +2 more | 2023-09-05 |
| 11709151 | Control method, inspection system, and storage medium | Atsushi Matsumura | 2023-07-25 |