Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11782426 | Abnormality score calculation apparatus, method, and medium | Jumpei ANDO, Wataru Watanabe, Toshiyuki Ono | 2023-10-10 |
| 11775512 | Data analysis apparatus, method and system | Wataru Watanabe, Jumpei ANDO, Keisuke KAWAUCHI, Toshiyuki Ono | 2023-10-03 |