Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11768726 | Delay fault testing of pseudo static controls | Aravinda Acharya, Prakash Narayanan | 2023-09-26 |
| 11680984 | Control data registers for scan testing | Aravinda Acharya, Nikita Naresh | 2023-06-20 |
| 11604221 | Clock shaper circuit for transition fault testing | Sriraj Chellappan, Shruti Gupta | 2023-03-14 |