Issued Patents 2023
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11803960 | Optical image contrast metric for optical target search | Huan Jin, Xiaochun Li, Zhifeng Huang | 2023-10-31 |
| 11783470 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Hucheng Lee, Xiaochun Li | 2023-10-10 |
| 11776108 | Deep learning based defect detection | Richard Wallingford, Ge Cong | 2023-10-03 |
| 11748872 | Setting up inspection of a specimen | Hong Chen, Bjorn Brauer, Abdurrahman Sezginer, Ge Cong, Xiaochun Li | 2023-09-05 |
| 11619592 | Selecting defect detection methods for inspection of a specimen | Bjorn Brauer, Hucheng Lee | 2023-04-04 |
| 11615993 | Clustering sub-care areas based on noise characteristics | Boshi Huang, Hucheng Lee, Vladimir Tumakov, Bjorn Brauer, Erfan Soltanmohammadi | 2023-03-28 |