Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11783470 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Sangbong Park, Xiaochun Li | 2023-10-10 |
| 11619592 | Selecting defect detection methods for inspection of a specimen | Bjorn Brauer, Sangbong Park | 2023-04-04 |
| 11615993 | Clustering sub-care areas based on noise characteristics | Boshi Huang, Vladimir Tumakov, Sangbong Park, Bjorn Brauer, Erfan Soltanmohammadi | 2023-03-28 |