Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11842880 | Estimation model generation method and electron microscope | Shigeyuki Morishita, Fuminori Uematsu, Tomohiro Nakamichi, Keito Aibara | 2023-12-12 |
| 11764029 | Method of measuring aberration and electron microscope | Shigeyuki Morishita, Fuminori Uematsu, Tomohiro Nakamichi, Keito Aibara | 2023-09-19 |
| 11545337 | Scanning transmission electron microscope and adjustment method of optical system | — | 2023-01-03 |