Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11842880 | Estimation model generation method and electron microscope | Ryusuke Sagawa, Fuminori Uematsu, Tomohiro Nakamichi, Keito Aibara | 2023-12-12 |
| 11764029 | Method of measuring aberration and electron microscope | Ryusuke Sagawa, Fuminori Uematsu, Tomohiro Nakamichi, Keito Aibara | 2023-09-19 |