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Systems and methods for semiconductor adaptive testing using inline defect part average testing |
David W. Price, Chet V. Lenox, Oreste Donzella, Kara L. Sherman, John Robinson |
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| 11754625 |
System and method for identifying latent reliability defects in semiconductor devices |
David W. Price, Chet V. Lenox, Robert Cappel, Oreste Donzella, Kara L. Sherman |
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| 11656274 |
Systems and methods for evaluating the reliability of semiconductor die packages |
David W. Price, Chet V. Lenox, Oreste Donzella |
2023-05-23 |
| 11624775 |
Systems and methods for semiconductor defect-guided burn-in and system level tests |
David W. Price, Chet V. Lenox, Oreste Donzella, John Robinson |
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| 11614480 |
System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures |
David W. Price, Chet V. Lenox, Oreste Donzella, John Robinson |
2023-03-28 |