Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11763446 | Wafer bin map based root cause analysis | Tomonori Honda, Lin Lee Cheong, Qing Zhu, Jeffrey Drue David, Michael Keleher | 2023-09-19 |
| 11687439 | Automatic window generation for process trace | Kazuki Kunitoshi, Michio Aruga, Nobichika Akiya | 2023-06-27 |
| 11640160 | Pattern-enhanced spatial correlation of test structures to die level responses | Qing Zhu | 2023-05-02 |
| 11640328 | Predicting equipment fail mode from process trace | Kazuki Kunitoshi | 2023-05-02 |
| 11609812 | Anomalous equipment trace detection and classification | Jeffrey Drue David, Qing Zhu, Tomonori Honda, Lin Lee Cheong | 2023-03-21 |