Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699017 | Die yield assessment based on pattern-failure rate simulation | Young-Chang Kim, Andrew Burbine, Christopher Heinz Clifford | 2023-07-11 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699017 | Die yield assessment based on pattern-failure rate simulation | Young-Chang Kim, Andrew Burbine, Christopher Heinz Clifford | 2023-07-11 |