Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11639901 | Test structure design for metrology measurements in patterned samples | Gilad Barak, Oded Cohen | 2023-05-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11639901 | Test structure design for metrology measurements in patterned samples | Gilad Barak, Oded Cohen | 2023-05-02 |