Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11802829 | Method and system for broadband photoreflectance spectroscopy | Yonatan Oren | 2023-10-31 |
| 11740183 | Accurate Raman spectroscopy | Elad Schleifer, Yonatan Oren, Amir Shayari, Eyal Hollander, Valery Deich +1 more | 2023-08-29 |
| 11692953 | X-ray based measurements in patterned structure | — | 2023-07-04 |
| 11639901 | Test structure design for metrology measurements in patterned samples | Oded Cohen, Igor Turovets | 2023-05-02 |
| 11543294 | Optical technique for material characterization | Yonatan Oren | 2023-01-03 |