AK

Abhay Kotecha

FE Fei: 1 patents #27 of 106Top 30%
Overall (2023): #534,814 of 537,848Top 100%
1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11810751 Method of imaging a specimen using a transmission charged particle microscope Peter Christiaan Tiemeijer, Evgeniia Pechnikova, Rudolf Geurink, Jamie McCormack 2023-11-07