Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11817290 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2023-11-14 |
| 11810751 | Method of imaging a specimen using a transmission charged particle microscope | Evgeniia Pechnikova, Rudolf Geurink, Abhay Kotecha, Jamie McCormack | 2023-11-07 |
| 11804357 | Electron optical module for providing an off-axial electron beam with a tunable coma | Ali Mohammadi-Gheidari, Alexander Henstra, Tomas Radlicka | 2023-10-31 |
| 11715618 | System and method for reducing the charging effect in a transmission electron microscope system | Yuchen Deng, Alexander Henstra | 2023-08-01 |
| 11587759 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2023-02-21 |