Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11817290 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Peter Christiaan Tiemeijer, Tjerk G. Spanjer | 2023-11-14 |
| 11587759 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Peter Christiaan Tiemeijer, Tjerk G. Spanjer | 2023-02-21 |