JB

Jonathan Op de Beeck

IV Imec Vzw: 1 patents #59 of 211Top 30%
KR Katholieke Universiteit Leuven, Ku Leuven R&D: 1 patents #2 of 46Top 5%
📍 Zonhoven, BE: #3 of 10 inventorsTop 30%
Overall (2023): #385,566 of 537,848Top 75%
1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11549963 Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample Kristof Paredis, Claudia Fleischmann, Wilfried Vandervorst 2023-01-10