Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11549963 | Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample | Kristof Paredis, Jonathan Op de Beeck, Wilfried Vandervorst | 2023-01-10 |