Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11614324 | Non-destructive bond line thickness measurement of thermal interface material on silicon packages | Hongqing Zhang, Jay A. Bunt, David J. Lewison, Yu Luo | 2023-03-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11614324 | Non-destructive bond line thickness measurement of thermal interface material on silicon packages | Hongqing Zhang, Jay A. Bunt, David J. Lewison, Yu Luo | 2023-03-28 |