PP

Pavel Potocek

FE Fei: 1 patents #27 of 106Top 30%
Overall (2023): #300,355 of 537,848Top 60%
1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11741730 Charged particle microscope scan masking for three-dimensional reconstruction Maurice Peemen, Bert Henning Freitag 2023-08-29