Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11741730 | Charged particle microscope scan masking for three-dimensional reconstruction | Pavel Potocek, Bert Henning Freitag | 2023-08-29 |
| 11569056 | Parameter estimation for metrology of features in an image | Brad Larson, John Flanagan | 2023-01-31 |