Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815479 | Method of examining a sample using a charged particle beam apparatus | Ond{hacek over (r)}ej Machek, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Jan Klusá{hacek over (c)}ek, Kristýna Bukvi{hacek over (s)}ová, Mykola Kaplenko | 2023-11-14 |
| 11703468 | Method and system for determining sample composition from spectral data | Jan Klusá{hacek over (c)}ek, Tomá{hacek over (s)} Tůma, Mykola Kaplenko, Ond{hacek over (r)}ej Machek | 2023-07-18 |