Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815479 | Method of examining a sample using a charged particle beam apparatus | Oleksii Kaplenko, Ond{hacek over (r)}ej Machek, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Jan Klusá{hacek over (c)}ek, Mykola Kaplenko | 2023-11-14 |