| 1 |
Huilong Zhu |
Institute Of Microelectronics Of The Chinese Academy Of Sciences |
18 |
| 2 |
Maharaj Mukherjee |
IBM |
17 |
| 3 |
Jonathan D. Bradbury |
IBM |
16 |
| #4 |
Peter D. Driever |
IBM |
8 |
| #5 |
Deanna Postles Dunn Berger |
IBM |
7 |
| #5 |
Matthias Klein |
IBM |
7 |
| #5 |
Rasit Onur Topaloglu |
IBM |
7 |
| #5 |
Michael James Becht |
IBM |
7 |
| #9 |
Sean P. O'Donnell |
Dell Products |
5 |
| #9 |
David Wolpert |
IBM |
5 |
| #9 |
Dale E. Blue |
IBM |
5 |
| #12 |
Dale F. Riedy |
IBM |
4 |
| #12 |
Fadi Y. Busaba |
IBM |
4 |
| #12 |
John G. Torok |
IBM |
4 |
| #12 |
Kafai Lai |
IBM |
4 |
| #12 |
Patrick J. Meaney |
IBM |
4 |
| #12 |
Yuk L. Chan |
IBM |
4 |
| #18 |
Budy D. Notohardjono |
IBM |
3 |
| #18 |
Aaron Tsai |
IBM |
3 |
| #18 |
William T. Maslyn |
Place Exchange |
3 |
| #18 |
Louis P. Gomes |
IBM |
3 |
| #18 |
Jeffrey Willoughby |
IBM |
3 |
| #18 |
Emily R. Kinser |
IBM |
3 |
| #24 |
Vivek Salve |
IBM |
2 |
| #24 |
Jennifer A. Oakley |
IBM |
2 |
| #24 |
Mark L. Demarie |
IBM |
2 |
| #24 |
Patrick Cupka |
IBM |
2 |
| #24 |
Jon A. Casey |
IBM |
2 |
| #24 |
Vincent J. McGahay |
IBM |
2 |
| #24 |
Gavin Charles Richards |
Goodrich |
2 |
| #24 |
Luke L. Jenkins |
IBM |
2 |
| #24 |
Chris Aaron Cavitt |
IBM |
2 |
| #24 |
Tynan J. Garrett |
IBM |
2 |
| #24 |
Shao-fu Sanford Chu |
Chartered Semiconductor Manufacturing |
2 |
| #24 |
Michael J. Fisher |
IBM |
2 |
| #24 |
David J. Lee |
Applied Materials |
2 |
| #24 |
John Bruley |
IBM |
2 |
| #24 |
Shawn Canfield |
IBM |
2 |
| #24 |
Levi A. Campbell |
IBM |
2 |
| #24 |
Mark Klare |
Nova Measuring Instruments |
2 |
| #24 |
Christian Wilhelmus Baks |
IBM |
2 |
| #24 |
Ofer Geva |
IBM |
2 |
| #24 |
Steven R. Carlough |
IBM |
2 |
| #24 |
William P. LePera |
IBM |
2 |
| #24 |
Enci Zhong |
IBM |
2 |
| #24 |
Felipe Knop |
IBM |
2 |
| #24 |
Patricia G. Driever |
IBM |
2 |
| #24 |
Charles L. Arvin |
IBM |
2 |
| #24 |
Kamal K. Sikka |
IBM |
2 |
| #24 |
Gary A. Van Huben |
IBM |
2 |