Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11797557 | Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis | Fei Yuan, Hong Wang, Jianmin Wu, Tian Lan, Yue Tang +4 more | 2023-10-24 |
| 11703837 | System and method for recommending maximum quantity of work in process, and computer readable medium | Dong Chai, Haohan Wu, Tian Lan, Weihe Liu | 2023-07-18 |