Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11809438 | Method and device of detecting fault in production | Hong Wang, Dong Chai, Haohan Wu, Xuefeng Kan, Tian Lan | 2023-11-07 |
| 11797557 | Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis | Fei Yuan, Hong Wang, Jianmin Wu, Guoliang Shen, Tian Lan +4 more | 2023-10-24 |