Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11769317 | Fully automated SEM sampling system for e-beam image enhancement | Wentian ZHOU, Liangjiang YU, Lingling PU, Wei Fang | 2023-09-26 |
| 11756187 | Systems and methods of optimal metrology guidance | Lingling PU, Wei Fang, Nan Zhao, Wentian ZHOU, Ming Xu | 2023-09-12 |