Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11796978 | Method for determining root causes of events of a semiconductor manufacturing process and for monitoring a semiconductor manufacturing process | Chang-Wei Chen | 2023-10-24 |
| 11774869 | Method and system for determining overlay | Ruud Hendrikus Martinus Johannes Bloks, Hendrik Cornelis Anton Borger, Frederik Eduard De Jong, Johan Gertrudis Cornelis Kunnen, Siebe Landheer +3 more | 2023-10-03 |