Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11620558 | Iterative machine learning based techniques for value-based defect analysis in large data sets | Yifan Xu, Marc Wichterich | 2023-04-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11620558 | Iterative machine learning based techniques for value-based defect analysis in large data sets | Yifan Xu, Marc Wichterich | 2023-04-04 |