Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11620558 | Iterative machine learning based techniques for value-based defect analysis in large data sets | Xue Wang, Marc Wichterich | 2023-04-04 |
| 11580177 | Identifying information using referenced text | Chen Sun | 2023-02-14 |