Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378388 | Substrate inspection method, substrate inspection apparatus and recording medium | Kazuya Hisano, Akiko Kiyotomi, Keisuke Hamamoto, Tadashi Nishiyama | 2022-07-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378388 | Substrate inspection method, substrate inspection apparatus and recording medium | Kazuya Hisano, Akiko Kiyotomi, Keisuke Hamamoto, Tadashi Nishiyama | 2022-07-05 |