Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378388 | Substrate inspection method, substrate inspection apparatus and recording medium | Akiko Kiyotomi, Yasuaki Noda, Keisuke Hamamoto, Tadashi Nishiyama | 2022-07-05 |
| 11268912 | Substrate inspection method and substrate inspection apparatus | Akiko Kiyotomi | 2022-03-08 |