Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11448692 | Method and device for wafer-level testing | Jun He, Yu-Ting Lin, Wei-Hsun Lin, Yinlung Lu | 2022-09-20 |
YK
Yung-Liang Kuo
Overall (2022): #192,988 of 548,613Top 40%
1
Patents 2022