Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11487210 | Method and system of surface topography measurement for lithography | Yung-Yao Lee, Yang-Ann Chu, Yung-Hsiang Chen, Yung-Cheng Chen | 2022-11-01 |
YW
Yeh-Chin Wang
Overall (2022): #201,672 of 548,613Top 40%
1
Patents 2022