Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11355040 | Method and test equipment for inspecting functionality of display device | Sheng Sun, Jia-Yu Wang, Kun-Yen Wu | 2022-06-07 |
| 11289338 | Method for improved critical dimension uniformity in a semiconductor device fabrication process | Chun-Kuang Chen, De-Fang Chen, Wei-Liang Lin, Yu-Tien Shen | 2022-03-29 |
| 11271103 | Semiconductor device and manufacturing process thereof | Pohan Kung, Ying-Jing Lu, Yu-Sheng Wang, Shiu-Ko JangJian | 2022-03-08 |