Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11346795 | XPS metrology for process control in selective deposition | Kavita Shah, Wei Ti Lee | 2022-05-31 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11346795 | XPS metrology for process control in selective deposition | Kavita Shah, Wei Ti Lee | 2022-05-31 |