Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11346795 | XPS metrology for process control in selective deposition | Charles Thomas Larson, Wei Ti Lee | 2022-05-31 |
| 11277484 | Systems and methods for restricting generation and delivery of insights to second data source providers | Oleg Rogynskyy, David Flink, Wei Hai | 2022-03-15 |