Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353798 | Pattern measurement device and pattern measurement method | Takuma Yamamoto, Hiroya Ohta, Yusuke Abe, Tomohiro Tamori, Masaaki Nojiri | 2022-06-07 |
| 11276554 | Scanning electron microscope and method for measuring pattern | Takeyoshi Ohashi, Yusuke Abe, Kaori Bizen, Hyejin Kim | 2022-03-15 |
| 11251018 | Scanning electron microscope | Yasunari Sohda, Kaori Bizen, Yusuke Abe | 2022-02-15 |