Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353501 | Wafer inspection method and wafer probing system | Lin-Lin Chih, Chien-Hung Chen, Guan-Jhih Liou | 2022-06-07 |
| 11313883 | Probe station capable of maintaining position of probe tip upon temperature change | Jhih-Wei Fang, Sebastian Giessmann | 2022-04-26 |
| 11287475 | Method for compensating to distance between probe tip and device under test after temperature changes | Stojan Kanev, Chien-Hung Chen | 2022-03-29 |