Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11287475 | Method for compensating to distance between probe tip and device under test after temperature changes | Yu-Hsun Hsu, Chien-Hung Chen | 2022-03-29 |
| 11262401 | Wafer probe station | Chia-Hung Hung | 2022-03-01 |