Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353501 | Wafer inspection method and wafer probing system | Lin-Lin Chih, Chien-Hung Chen, Yu-Hsun Hsu | 2022-06-07 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11353501 | Wafer inspection method and wafer probing system | Lin-Lin Chih, Chien-Hung Chen, Yu-Hsun Hsu | 2022-06-07 |