Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11335428 | Methods, systems and apparatus for in-field testing for generic diagnostic components | Asad Azam, R Selvakumar Raja Gopal, Kaitlyn Chen | 2022-05-17 |
| 11257560 | Test architecture for die to die interconnect for three dimensional integrated circuits | Fei Su, Puneet Gupta, Wei Ming Lim, Terrence Huat Hin Tan, Amit Sanghani +4 more | 2022-02-22 |