Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11360398 | System and method for tilt calculation based on overlay metrology measurements | Roie Volkovich, Paul MacDonald, Ady Levy, Jincheng Pei, Amnon Manassen | 2022-06-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11360398 | System and method for tilt calculation based on overlay metrology measurements | Roie Volkovich, Paul MacDonald, Ady Levy, Jincheng Pei, Amnon Manassen | 2022-06-14 |