Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378451 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Tianhan Wang, Dawei Hu, Alexander Kuznetsov, Manh Dang Nguyen, Stilian Ivanov Pandev +8 more | 2022-07-05 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378451 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Tianhan Wang, Dawei Hu, Alexander Kuznetsov, Manh Dang Nguyen, Stilian Ivanov Pandev +8 more | 2022-07-05 |