Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11372340 | Method and system for providing a quality metric for improved process control | Daniel Kandel, Guy M. Cohen, Dana Klein, Vladimir Levinski, Noam Sapiens +3 more | 2022-06-28 |
| 11248905 | Machine learning in metrology measurements | — | 2022-02-15 |