Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11506787 | Sensor device and measurement method | Shoichi Ohnaka, Ryosuke Tsuzuki, Koji Iguchi, Osamu Harada | 2022-11-22 |
| 11302513 | Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatus | Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Akira Hamaguchi, Chihiro Ida | 2022-04-12 |
| 11294057 | Displacement sensor | Ryosuke Tsuzuki, Shoichi Ohnaka, Koji Iguchi, Osamu Harada | 2022-04-05 |