Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11355304 | Electronic microscope device | Takahiro Nishihata, Wei Sun, Takuma Yamamoto | 2022-06-07 |
| 11302513 | Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatus | Takahiro Nishihata, Takuma Yamamoto, Akira Hamaguchi, Yusuke Iida, Chihiro Ida | 2022-04-12 |