Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11397380 | Critical dimension measurement system and method of measuring critical dimensions using same | Hyung Joo Lee, Seuk Hwan Choi, Dong-Seok Nam, Yoon Taek Han | 2022-07-26 |