Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11397380 | Critical dimension measurement system and method of measuring critical dimensions using same | Won Joo Park, Hyung Joo Lee, Seuk Hwan Choi, Dong-Seok Nam | 2022-07-26 |
YH
Yoon Taek Han
Overall (2022): #198,936 of 548,613Top 40%
1
Patents 2022