Issued Patents 2022
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11532373 | Managing error-handling flows in memory devices | Kishore Kumar Muchherla, Mustafa N. Kaynak, Sampath K. Ratnam, Peter Feeley, Sivagnanam Parthasarathy +2 more | 2022-12-20 |
| 11450391 | Multi-tier threshold voltage offset bin calibration | Kishore Kumar Muchherla, Mustafa N. Kaynak, Karl D. Schuh, Jiangang Wu, Devin M. Batutis +1 more | 2022-09-20 |
| 11443830 | Error avoidance based on voltage distribution parameters of block families | Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Larry J. Koudele | 2022-09-13 |
| 11442641 | Voltage based combining of block families for memory devices | Michael Sheperek, Kishore Kumar Muchherla | 2022-09-13 |
| 11435919 | Associating multiple cursors with block family of memory device | Michael Sheperek, Bruce A. Liikanen, Peter Feeley, Larry J. Koudele, Steven Michael Kientz | 2022-09-06 |
| 11437108 | Voltage bin calibration based on a temporary voltage shift offset | Kishore Kumar Muchherla, Karl D. Schuh, Mustafa N. Kaynak, Xiangang Luo, Devin M. Batutis +4 more | 2022-09-06 |
| 11429309 | Adjusting a parameter for a programming operation based on the temperature of a memory system | Mustafa N. Kaynak, Sampath K. Ratnam, Zixiang Loh, Nagendra Prasad Ganesh Rao, Larry K Koudele +2 more | 2022-08-30 |
| 11410734 | Voltage bin selection for blocks of a memory device after power up of the memory device | Kishore Kumar Muchherla, Sampath K. Ratnam, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Karl D. Schuh +2 more | 2022-08-09 |
| 11404139 | Smart sampling for block family scan | Vamsi Pavan Rayaprolu, Michael Sheperek, Steven Michael Kientz | 2022-08-02 |
| 11393541 | Mitigating a voltage condition of a memory cell in a memory sub-system | Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Sivagnanam Parthasarathy +2 more | 2022-07-19 |
| 11372545 | Managing bin placement for block families of a memory device based on trigger metric values | Mustafa N. Kaynak | 2022-06-28 |
| 11354043 | Temperature-based block family combinations in a memory device | Steven Michael Kientz, Larry J. Koudele, Michael Sheperek, Bruce A. Liikanen | 2022-06-07 |
| 11340813 | Reliability scan assisted voltage bin selection | Vamsi Pavan Rayaprolu, Michael Sheperek | 2022-05-24 |
| 11270772 | Voltage offset bin selection by die group for memory devices | Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Michael Sheperek, Larry J. Koudele | 2022-03-08 |
| 11263134 | Block family combination and voltage bin selection | Michael Sheperek, Larry J. Koudele, Mustafa N. Kaynak | 2022-03-01 |
| 11231863 | Block family-based error avoidance for memory devices | Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu, Bruce A. Liikanen +3 more | 2022-01-25 |
| 11221912 | Mitigating an undetectable error when retrieving critical data during error handling | Vamsi Pavan Rayaprolu, Sivagnanam Parthasarathy, Sampath K. Ratnam, Renato C. Padilla | 2022-01-11 |