Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Roman Kris, Grigory Klebanov, Einat Frishman, Tal Orenstein, Meir Vengrover +3 more | 2022-09-13 |
| 11321835 | Determining three dimensional information | Anna Levant | 2022-05-03 |